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In electronic devices, material imperfections play a key role in determining lifespan as well as in safety considerations. In this video, CHRISTIAN LIEBSCHER puts such defects under the microscope so that we can better understand their atomic structure. Focusing on grain boundaries at which different crystals join together and using transmission electron microscopy, Liebscher explains how this research can bring about improvements in materials science and to the devices that we use in our daily lives.
DOI:
https://doi.org/10.21036/LTPUB10963

Researcher

Christian Liebscher is Group Leader for Advanced Transmission Electron Microscopy in Structure and Nano-/Micromechanics of Materials at the Max-Planck-Institut für EisenforschungGmbH. Having completed his PhD at the University of Bayreuth, Liebscher has previously worked at University Duisburg-Essen and at the University of California, Berkley. Author of a cover story in Physical Review Letters, Liebscher was awarded with a research fellowship from the German Science Foundation (DFG) in 2013-14.

Institution

Max-Planck-Institut für Eisenforschung

Novel alloys for automotive lightweight design and airplane turbines, materials for sustainable energy conversion and storage, and the development of big data and machine learning methods – these are just a few examples of the research areas that are being investigated by the scientists of the Max-Planck-Institut für Eisenforschung. The team of engineers, material scientists, physicists, and chemists develops tailored materials and methods for mobility, energy, infrastructure, and information. To this end, the researchers study complex materials with atomic precision under real environmental conditions.
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Original publication

Observations of Grain-Boundary Phase Transformations in an Elemental Metal

Meiners Thorsten, Frolov Timofey, Rudd Robert E., Dehm Gerhard and Liebscher Christian H.
Nature
Published in 2020

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Beyond